Atomic-force microscopy

Results: 458



#Item
221Scientific method / Analgesics / Raman spectroscopy / Intermolecular forces / Microscopy / Near-field scanning optical microscope / Spectroscopy / Atomic force microscopy / Raman scattering / Scanning probe microscopy / Chemistry / Science

NTEGRA Spectra: Pharmaceutical Application AFM-Raman Characterization of Pharmaceutical Tablets Compound Distribution Studies in Pharmaceutical Tablets by Integrated AFM-Raman Instrument

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Source URL: ntmdt.com

Language: English - Date: 2012-07-13 03:01:34
222Scientific method / Near-field scanning optical microscope / Raman spectroscopy / Graphene / Atomic force microscopy / Microscopy / Microscope / Magnetic force microscope / Piezoresponse force microscopy / Scanning probe microscopy / Chemistry / Science

Graphene Comprehensive AFM / Optical / Raman / TERS* Characterization in the Single Experiment White light image of the graphene flake with AFM tip and Raman laser spot

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Source URL: www.ntmdt.com

Language: English - Date: 2012-07-13 02:55:13
223Emerging technologies / Raman spectroscopy / Scanning probe microscopy / Carbon nanotube / Intermolecular forces / Nanomaterials / Raman scattering / Atomic force microscopy / Graphene / Chemistry / Science / Physics

Finding a needle in a chemical haystack: tip-enhanced Raman scattering for studying carbon nanotubes mixtures

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Source URL: www.ntmdt.com

Language: English - Date: 2012-07-13 02:47:38
224Chemistry / Intermolecular forces / Atomic force microscopy / Ficus / Microscopy / Spectroscopy / Vibrational analysis with scanning probe microscopy / Scanning probe microscopy / Scientific method / Science

High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA (a)

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Source URL: www.ntmdt.com

Language: English - Date: 2015-02-26 01:00:01
225Chemistry / Atomic force microscopy / Scanning tunneling microscope / Microscope / Microscopy / Magnetic force microscope / Piezoelectricity / Optical microscope / Near-field scanning optical microscope / Scanning probe microscopy / Science / Scientific method

РОССИЙСКАЯ АКАДЕМИЯ НАУК

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Source URL: www.ntmdt.com

Language: English - Date: 2012-10-11 05:12:38
226Chemistry / Atomic force microscopy / Microscopy / Scanning tunneling microscope / Microscope / Vibrational analysis with scanning probe microscopy / Magnetic force microscope / Scanning probe microscopy / Scientific method / Science

Vis-tion_16[removed]RBK.indd

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Source URL: www.ntmdt.com

Language: English - Date: 2013-06-11 06:31:10
227Chemistry / Focused ion beam / Electron microscope / Transmission electron microscopy / Scanning electron microscope / X-ray photoelectron spectroscopy / Characterization / Atomic force microscopy / Raman spectroscopy / Scientific method / Science / Electron microscopy

Automated Image Analysis Methods for Characterization and Measurement of Nanomaterials Center for Biological and Environmental Nanotechnology Rice University

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Source URL: smartimtech.com

Language: English - Date: 2006-01-31 06:16:22
228Magnetic resonance imaging / Scanning probe microscopy / Magnetism / Magnet / Resonance / Atomic force microscopy / Crystallographic defects / Physics / Electromagnetism / Science

Team creates MRI for the nanoscale

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Source URL: phys.org

Language: English - Date: 2015-04-17 12:09:07
229Chemistry / Nanotechnology / Intermolecular forces / Atomic force microscopy / Cantilever / Microscopy / Resonance / Science / Scientific method / Scanning probe microscopy

Measuring Boltzmann’s constant with a low-cost atomic force microscope: An undergraduate experiment M. Shusteff, T. P. Burg, and S. R. Manalisa兲 Biological Engineering Division, Massachusetts Institute of Technolog

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Source URL: manalis-lab.mit.edu

Language: English - Date: 2011-02-10 14:18:34
230Carbon nanotube / Chemistry / Scanning tunneling microscope / Atomic force microscopy / Scanning probe microscopy / Scientific method / Science

APPLIED PHYSICS LETTERS VOLUME 75, NUMBER[removed]NOVEMBER 1999

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Source URL: manalis-lab.mit.edu

Language: English - Date: 2011-02-10 14:18:35
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